Comparison of spectral irradiance standards used to calibrate shortwave radiometers and spectroradiometers

Applied Optics

Volumn 38, Issue 12, 1999, Pages 2432-2439

  Kiedron, Piotr W ^a   Michalsky, Joseph J ^a   Berndt, Jerry L ^a   Harrison, Lee C ^a  

^a STATE UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007700183     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.002432     Document Type: Article

References (13)

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