Systematic Deviations due to Random Noise Levels in Size Exclusion Chromatography Coupled with Multi Angle Laser Light Scattering

Analytical Communications

Volumn 34, Issue 10, 1997, Pages 295-297

  Tackx, P ^a   Bosscher, F ^b  

^a DSM RESEARCH   (Netherlands)

^b DOW BENELUX B V   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007691439     PISSN: 13597337     EISSN: None     Source Type: Journal    
DOI: 10.1039/a705998a     Document Type: Article

References (9)

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5. Radosta, S., and Vorwerg, W., Dawn Users' Forum, 1996, Köln.
6. Podzimek, S., Dawn Users' Forum, 1996, Köln.
7. Wintermantel, M., Antonietti, M., and Schmidt, M., J. Appl. Polym. Sci., 1993, 52, 91.
8. Johann, C., LaborPraxis, 1989, 1106.
9. Wyatt, P. J., Dawn Users' Forum, 1996, Köln.