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Volumn 112, Issue 11, 1999, Pages 1261-1269
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Comparative study of 〈111〉 and 〈100〉 crystals and capacitance measurements on Si strip detectors in CMS
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0007682505
PISSN: 03693546
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (4)
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References (3)
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