Line Intensities for the 8-μm Bands of SO2

Journal of Molecular Spectroscopy

Volumn 189, Issue 1, 1998, Pages 55-63

  Chu, P M ^a   Wetzel, S J ^a   Lafferty, W J ^a   Perrin, A ^b   Flaud, J M ^b   Areas, Ph ^b   Guelachvili, G ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007678113     PISSN: 00222852     EISSN: None     Source Type: Journal    
DOI: 10.1006/jmsp.1997.7517     Document Type: Article

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