-
1
-
-
0029287950
-
The (220) lattice spacing of Silicon
-
Basile G, Bergamin A, Cavagnero G, Mana G, Vittore E & Zosi G 1995 The (220) lattice spacing of Silicon. IEEE Transactions on Instrumentation and Measurement 44:526-529.
-
(1995)
IEEE Transactions on Instrumentation and Measurement
, vol.44
, pp. 526-529
-
-
Basile, G.1
Bergamin, A.2
Cavagnero, G.3
Mana, G.4
Vittore, E.5
Zosi, G.6
-
2
-
-
0011007295
-
The 1986 adjustment of the fundamental physical constants
-
Cohen E R & Taylor B N 1987 The 1986 adjustment of the fundamental physical constants. Review of Modern Physics 59:1121-1148.
-
(1987)
Review of Modern Physics
, vol.59
, pp. 1121-1148
-
-
Cohen, E.R.1
Taylor, B.N.2
-
3
-
-
0025150084
-
Isotope dilution mass spectrometry: What can it contribute to accuracy in trace analysis?
-
De Bièvre P 1990 Isotope dilution mass spectrometry: What can it contribute to accuracy in trace analysis? Fresenius Journal of Analytical Chemistry 337:766-771.
-
(1990)
Fresenius Journal of Analytical Chemistry
, vol.337
, pp. 766-771
-
-
De Bièvre, P.1
-
4
-
-
37049082790
-
Isotope dilution mass spectrometry as a primary method of analysis
-
De Bièvre P 1993 Isotope dilution mass spectrometry as a primary method of analysis. Analytical Proceedings 30:328-333.
-
(1993)
Analytical Proceedings
, vol.30
, pp. 328-333
-
-
De Bièvre, P.1
-
6
-
-
0001733395
-
The chemical preparation and characterization of specimens for "absolute" measurements of the molar mass of an element, exemplified by silicon, for redeterminations of the Avogadro constant
-
De Bièvre P, Lenaers G, Murphy T J, Peiser H S & Valkiers S 1995 The chemical preparation and characterization of specimens for "absolute" measurements of the molar mass of an element, exemplified by silicon, for redeterminations of the Avogadro constant. Metrologia 32:103-110.
-
(1995)
Metrologia
, vol.32
, pp. 103-110
-
-
De Bièvre, P.1
Lenaers, G.2
Murphy, T.J.3
Peiser, H.S.4
Valkiers, S.5
-
8
-
-
0029292867
-
A more accurate value for the Avogadro Constant. Conference on Precision Electromagnetic Measurements
-
De Bièvre P, Valkiers S, Peiser H S, Becker P, Lüdicke F, Spieweck F & Stümpel J 1995 A more accurate value for the Avogadro Constant. Conference on Precision Electromagnetic Measurements. IEEE Transactions on Instrumentation and Measurement 44:530-532.
-
(1995)
IEEE Transactions on Instrumentation and Measurement
, vol.44
, pp. 530-532
-
-
De Bièvre, P.1
Valkiers, S.2
Peiser, H.S.3
Becker, P.4
Lüdicke, F.5
Spieweck, F.6
Stümpel, J.7
-
9
-
-
0000475373
-
High-accuracy isotope abundance measurements for Metrology
-
De Bièvre P, Valkiers S, Schaefer F, Peiser H S & Seyfried P 1994 High-accuracy isotope abundance measurements for Metrology. PTB Mitteilungen 104:225-236.
-
(1994)
PTB Mitteilungen
, vol.104
, pp. 225-236
-
-
De Bièvre, P.1
Valkiers, S.2
Schaefer, F.3
Peiser, H.S.4
Seyfried, P.5
-
10
-
-
0002003207
-
X-ray interferometry and Y-ray wavelengths
-
ed. B Kramer. VCH, Weinheim
-
Deslattes R 1988 X-ray interferometry and Y-ray wavelengths. In: The Art of Measurement (ed. B Kramer). VCH, Weinheim, 193-208.
-
(1988)
The Art of Measurement
, pp. 193-208
-
-
Deslattes, R.1
-
11
-
-
0001310460
-
Determination of the Avogadro constant
-
Deslattes R D, Hennis A, Bowman H A, Schoonover R M & Carroll C L 1974 Determination of the Avogadro constant. Physical Review Letters 33:463-466.
-
(1974)
Physical Review Letters
, vol.33
, pp. 463-466
-
-
Deslattes, R.D.1
Hennis, A.2
Bowman, H.A.3
Schoonover, R.M.4
Carroll, C.L.5
-
12
-
-
0001648367
-
Avogadro constant - Corrections to an earlier report
-
Deslattes R D, Hennis A, Schoonover R M, Carroll C L & Bowman H A 1976 Avogadro constant - Corrections to an earlier report. Physical Review Letters 36:898-899.
-
(1976)
Physical Review Letters
, vol.36
, pp. 898-899
-
-
Deslattes, R.D.1
Hennis, A.2
Schoonover, R.M.3
Carroll, C.L.4
Bowman, H.A.5
-
13
-
-
0029290316
-
Absolute measurement of the density of silicon crystals in vacuo for a determination of the Avogadro Constant
-
Fujii K, Tanaka M, Nezu Y, Sakuma A, Leistner A & Giardini W 1995 Absolute measurement of the density of silicon crystals in vacuo for a determination of the Avogadro Constant. IEEE Transactions on Instrumentation and Measurement 44:542-545.
-
(1995)
IEEE Transactions on Instrumentation and Measurement
, vol.44
, pp. 542-545
-
-
Fujii, K.1
Tanaka, M.2
Nezu, Y.3
Sakuma, A.4
Leistner, A.5
Giardini, W.6
-
15
-
-
0029290315
-
The IMGC volume-density standards for the Avogadro Constant
-
Sacconi A, Peuto A M, Mosca M, Panciera R, Pasin W & Pettorruso S 1995 The IMGC volume-density standards for the Avogadro Constant. IEEE Transactions on Instrumentation and Measurement 44:533-537.
-
(1995)
IEEE Transactions on Instrumentation and Measurement
, vol.44
, pp. 533-537
-
-
Sacconi, A.1
Peuto, A.M.2
Mosca, M.3
Panciera, R.4
Pasin, W.5
Pettorruso, S.6
-
16
-
-
0001766004
-
A determination of the Avogadro constant
-
Zeitschrift für Physik B
-
Seyfried P, Becker P, Kozdon A, Lüdicke F, Spieweck F, Stümpel J, Wagenbreth H, Windisch D, De Bièvre P, Ku H H, Lenaers G, Murphy T J, Peiser H S & Valkiers S 1992 A determination of the Avogadro constant. Zeitschrift für Physik B. Condensed Matter 87:289-298.
-
(1992)
Condensed Matter
, vol.87
, pp. 289-298
-
-
Seyfried, P.1
Becker, P.2
Kozdon, A.3
Lüdicke, F.4
Spieweck, F.5
Stümpel, J.6
Wagenbreth, H.7
Windisch, D.8
De Bièvre, P.9
Ku, H.H.10
Lenaers, G.11
Murphy, T.J.12
Peiser, H.S.13
Valkiers, S.14
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