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Volumn 79, Issue 1, 1996, Pages 11-19

Ultra-high accuracy isotopic measurements: Avogadro's constant is up!

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[No Author keywords available]

Indexed keywords


EID: 0007563411     PISSN: 0035922X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (5)

References (17)
  • 2
    • 0011007295 scopus 로고
    • The 1986 adjustment of the fundamental physical constants
    • Cohen E R & Taylor B N 1987 The 1986 adjustment of the fundamental physical constants. Review of Modern Physics 59:1121-1148.
    • (1987) Review of Modern Physics , vol.59 , pp. 1121-1148
    • Cohen, E.R.1    Taylor, B.N.2
  • 3
    • 0025150084 scopus 로고
    • Isotope dilution mass spectrometry: What can it contribute to accuracy in trace analysis?
    • De Bièvre P 1990 Isotope dilution mass spectrometry: What can it contribute to accuracy in trace analysis? Fresenius Journal of Analytical Chemistry 337:766-771.
    • (1990) Fresenius Journal of Analytical Chemistry , vol.337 , pp. 766-771
    • De Bièvre, P.1
  • 4
    • 37049082790 scopus 로고
    • Isotope dilution mass spectrometry as a primary method of analysis
    • De Bièvre P 1993 Isotope dilution mass spectrometry as a primary method of analysis. Analytical Proceedings 30:328-333.
    • (1993) Analytical Proceedings , vol.30 , pp. 328-333
    • De Bièvre, P.1
  • 6
    • 0001733395 scopus 로고
    • The chemical preparation and characterization of specimens for "absolute" measurements of the molar mass of an element, exemplified by silicon, for redeterminations of the Avogadro constant
    • De Bièvre P, Lenaers G, Murphy T J, Peiser H S & Valkiers S 1995 The chemical preparation and characterization of specimens for "absolute" measurements of the molar mass of an element, exemplified by silicon, for redeterminations of the Avogadro constant. Metrologia 32:103-110.
    • (1995) Metrologia , vol.32 , pp. 103-110
    • De Bièvre, P.1    Lenaers, G.2    Murphy, T.J.3    Peiser, H.S.4    Valkiers, S.5
  • 10
    • 0002003207 scopus 로고
    • X-ray interferometry and Y-ray wavelengths
    • ed. B Kramer. VCH, Weinheim
    • Deslattes R 1988 X-ray interferometry and Y-ray wavelengths. In: The Art of Measurement (ed. B Kramer). VCH, Weinheim, 193-208.
    • (1988) The Art of Measurement , pp. 193-208
    • Deslattes, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.