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Physical Review B - Condensed Matter and Materials Physics

Volumn 60, Issue 11, 1999, Pages 7752-7755

Direct measurement of quantum-state dispersion in an accumulation layer at a semiconductor surface

(7) Aristov, V Yu a,b,c Le Lay, G a,b Zhilin, V M c Indlekofer, G d Grupp, C d Taleb Ibrahimi, A d Soukiassian, P d,e

a CAMPUS DE LUMINY (France)

b AIX MARSEILLE UNIVERSITY (France)

c INSTITUTE OF SOLID STATE PHYSICS (Russian Federation)

d UNIVERSITÉ PARIS SACLAY (France)

e CEA SACLAY (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007492749 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.60.7752 Document Type: Article

Times cited : (36)

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