Neural network correction of nonlinearities in scanning probe microscope images

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1563-1568

  Hadjiiski, L ^a   Munster S ^a   Oesterschulze, E ^a   Kassing, R ^a  

^a UNIVERSITY OF KASSEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007353553     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589139     Document Type: Article

References (5)

1. J. E. Griffith, G. L. Miller, and C. A. Green, J. Vac. Sci. Technol. B 8, (1990).
2. G. Cybenko, Math Control Signal Syst. 2, 303 (1989).
3. D. Rumelhart, G. E. Hinton, and R. J. Williams, in Parallel and Distributed Processing, edited by D. E. Rumelhart (MIT Press, Cambridge, MA, 1986), Vol. 1, p. 318.
4. L. Hadjiiski, R. Linnemann, M. Stopka, E. Oesterschulze, I. Rangelow, and R. Kassing, Thin Solid Films (to be published).
5. L. Hadjiiski, E. Oesterschulze, S. Hentschke, and R. Kassing, IEEE Trans. Image Process. (to be published).