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1
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0024620561
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(1989)
Nucl. Instrum. Methods Phys. Res. Sect. B
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Meda, L.1
Cerofolini, G.F.2
Dierckx, R.3
Mercurio, G.4
Servidori, M.5
Cembali, F.6
Anderle, M.7
Canteri, R.8
Ottaviani, G.9
Claeys, C.10
Vanhellemont, J.11
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5
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0010016213
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edited by, S. Namba, Plenum, New York
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(1975)
Ion Implantation in Semiconductors
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Mitchell, J.B.1
Davies, J.A.2
Howe, L.M.3
Walker, R.S.4
Winterbon, K.B.5
Foti, G.6
Moore, J.A.7
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6
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Nonlinear phenomena in hydrogen implantation into (100) silicon
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(1989)
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Cerofolini, G.F.1
Meda, L.2
Volpones, C.3
Dierckx, R.4
Mercurio, G.5
Anderle, M.6
Canteri, R.7
Cembali, F.8
Fabbri, R.9
Servidori, M.10
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12
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84926592364
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TRIM-89, The Transport of Ions in Matter (Version 5.3), March 7, 1989 (unpublished).
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Ziegler, J.F.1
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13
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0024751874
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The paradoxical behavior of the bulk peak at different implantation temperatures in relation to the expected behavior and to previous experimental evidence is discussed in
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(1989)
Mater. Sci. Eng. B
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Cerofolini, G.F.1
Ottaviani, G.2
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15
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0347760964
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(1988)
Phys. Rev. B
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Keinonen, J.1
Hautala, M.2
Rauhala, E.3
Karttunen, V.4
Kuronen, A.5
Räisänen, J.6
Lahtinen, J.7
Vehanen, A.8
Punkka, E.9
Hautojärvi, P.10
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17
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84926596631
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G. F. Cerofolini, in Point and Extended Defects in Semiconductors, edited by G. Benedek, A. Cavallini, and W. Schröter, (Plenum, New York, 1989), p. 123.
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23
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84926592086
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Though Picraux and Vook did not specify the beam current density of their experiment, this quantity is presumably of the same order as in our RT experiment. Extreme care must, however, be used when deuterium data are considered to simulate the behavior of hydrogen. Indeed, while the annealing kinetics are expected to be sensitive to isotope effects only, the released damages (and hence the defective structures of the target) in 1 H- and 2H-implanted silicon differ remarkably. We have verified, both with numerical simulation ( TRIM, Ref. 12) and with RBS analysis (data not shown, to be published elsewhere), that the distributions of the implanted deuterium and of displaced silicon at given energy are deeper than the corresponding distributions resulting after hydrogen implantation.
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25
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0022893443
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edited by, H. R. Huff, T. Abe, B. Kolbesen, The Electrochemical Society, Pennington, NJ
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(1986)
Semiconductor Silicon 1986
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Cerofolini, G.F.1
Meda, L.2
Polignano, M.L.3
Ottaviani, G.4
Armigliato, A.5
Solmi, S.6
Bender, H.7
Claeys, C.8
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