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Volumn 41, Issue 18, 1990, Pages 12607-12618

Structure and evolution of the displacement field in hydrogen-implanted silicon

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Indexed keywords


EID: 0007320405     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.41.12607     Document Type: Article
Times cited : (31)

References (27)
  • 12
    • 84926592364 scopus 로고    scopus 로고
    • TRIM-89, The Transport of Ions in Matter (Version 5.3), March 7, 1989 (unpublished).
    • Ziegler, J.F.1
  • 13
    • 0024751874 scopus 로고
    • The paradoxical behavior of the bulk peak at different implantation temperatures in relation to the expected behavior and to previous experimental evidence is discussed in
    • (1989) Mater. Sci. Eng. B , vol.4 , pp. 19
    • Cerofolini, G.F.1    Ottaviani, G.2
  • 17
    • 84926596631 scopus 로고    scopus 로고
    • G. F. Cerofolini, in Point and Extended Defects in Semiconductors, edited by G. Benedek, A. Cavallini, and W. Schröter, (Plenum, New York, 1989), p. 123.
  • 23
    • 84926592086 scopus 로고    scopus 로고
    • Though Picraux and Vook did not specify the beam current density of their experiment, this quantity is presumably of the same order as in our RT experiment. Extreme care must, however, be used when deuterium data are considered to simulate the behavior of hydrogen. Indeed, while the annealing kinetics are expected to be sensitive to isotope effects only, the released damages (and hence the defective structures of the target) in 1 H- and 2H-implanted silicon differ remarkably. We have verified, both with numerical simulation ( TRIM, Ref. 12) and with RBS analysis (data not shown, to be published elsewhere), that the distributions of the implanted deuterium and of displaced silicon at given energy are deeper than the corresponding distributions resulting after hydrogen implantation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.