Ballistic-electron-emission-spectroscopy detection of monolayer thickness fluctuations in a semiconductor heterostructure

Applied Physics Letters

Volumn 75, Issue 2, 1999, Pages 283-285

  Guthrie, D K ^a   First, P N ^a   Gaylord, T K ^a   Glytsis, E N ^a   Leibenguth, R E ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007272128     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124349     Document Type: Article

References (10)

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