Fractal analysis of atomic force microscopy pictures of slip lines on a GaAs/GaAlAs heterostructure plastically deformed to obtain quantum wires

Journal of Applied Physics

Volumn 79, Issue 11, 1996, Pages 8298-8303

  Ressier, L ^a   Voillot, F ^a   Goiran, M ^a   Peyrade, J P ^a   Vieu, C ^b  

^a Laboratoire de Physique des Solides   (France)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007258585     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362540     Document Type: Review

References (12)

1. J. P. Peyrade, F. Voillot, M. Goiran, H. Atmani, and A. Rocher, Appl. Phys. Lett. 60, 2481 (1992).
2. M. Goiran, C. Guasch, F. Voillot, R. Carles, J. P. Peyrade, E. Bedel, and A. Muñoz-Yague, Europhys. Lett. 23, 647 (1993).
3. B. B. Mandelbrot, The Fractal Geometry of Nature (Freeman, New York, 1983).
4. B. Sprusil and F. Hnilica, Czech. J. Phys. B 35, 897 (1985).
5. B. Sprusil, H. U. Fritsch, and B. L. Mordike, Z. Metallkd. 79, 50 (1988).
6. B. Sprusil and F. Hnilica, Czech. J. Phys. B 38, 188 (1988).
7. T. Kleiser and M. Bocek, Z. Metallkd. 77, 582 (1986).
8. I. R. Göbel, Z. Metallkd. 82, 858 (1991).
9. C. Guasch, thesis, INSAT, 1994.
10. 2 AFM pictures are formed by 512×512 pixels: A pixel represents about 200 μm. The eye is able to resolve 1 pixel (in fact, the lateral theorical eye resolution on a picture seen at a distance of 250 mm is about 75 μm) but one observes that a minimum of 6-7 pixels is necessary to obtain a sufficient contrast which enables one to resolve two neighboring slip lines by eye. The same remarks are applicable to region B.
11. F. Louchet, Solid State Phenom. 35-36, 57 (1994).
12. K. L. Westra and D. J. Thomson, J. Vac. Sci. Technol B 13, 344 (1995).