Critical Evaluation of the Midgap-Voltage-Shift Method for Determining Oxide Trapped Charge in Irradiated MOS Devices

IEEE Transactions on Nuclear Science

Volumn 34, Issue 6, 1987, Pages 1159-1165

  Shanfield, Z ^a   Moriwaki, M M ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007168199     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1987.4337446     Document Type: Article

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