Transmission of polarized infrared radiation through lamellar gratings on a silicon wafer

Journal of Applied Physics

Volumn 84, Issue 4, 1998, Pages 2236-2244

  Hava, S ^a   Ivri, J ^a   Auslender, M ^a  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007157332     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368289     Document Type: Article

References (8)

1. E. Yablonovitch, J. Mod. Opt. 41, 173 (1994).
2. K. Knop, Appl. Opt. 17, 3598 (1978).
3. S. Hava, M. Auslender, B. M. Lacquet, P. J. Coetzer, and P. L. Swart, Infrared Phys. Technol. 36, 639 (1995).
4. S. Hava, J. Ivri, M. Auslender, and B. M. Lacquet, J. Appl. Phys. 83, 1 (1998).
5. M. Born and E. Wolf, Principles of Optics, sixth ed. (Pergamon, Oxford, 1980).
6. D. F. Edwards, in Handbook of Optical Constants of Solids, edited by E. Palik (Academic, New York, 1985), p. 547.
7. K. Krishnan, P. Stout, and M. Watanabe, in Practical Fourier Transform Infrared Spectroscopy (Academic, Press, New York, 1985), Chap. 6, p. 285.
8. H. O. McMachon, J. Opt. Soc. Am. 40, 376 (1950).