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Volumn 105, Issue 1, 2000, Pages 63-70

Sub-Nanosecond Lifetime Measurement Using the Recoil-Distance Method

Author keywords

Lifetime measurements; Low lying states; Recoil distance method

Indexed keywords


EID: 0007142350     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.105.008     Document Type: Article
Times cited : (1)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.