Observation of quantum interference effects in submicron CoSi2 wires in Si(100)

Applied Physics Letters

Volumn 71, Issue 24, 1997, Pages 3540-3542

  Lenssen, D ^a   Mantl, S ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007141140     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120384     Document Type: Article

References (15)

1. K. Maex, Mater. Sci. Eng. R11, 53 (1993).
2. S. Mantl, Mater. Sci. Rep. 8, 1 (1992).
3. K. Radermacher, D. Monroe, A. E. White, K. T. Short, and R. Jebasinski, Phys. Rev. B 48, 8002 (1993).
4. N. M. Zimmerman, J. A. Liddle, A. E. White, and K. T. Short, Appl. Phys. Lett. 62, 387 (1993).
5. 2 wires are not affected within the measurement accuracy by the presence of the surface layer.
6. J. A. Liddle, N. M. Zimmerman, A. E. White, K. T. Short, and L. Fetter, Mater. Res. Soc. Symp. Proc. 279, 881 (1993).
7. L. F. Mattheiss and D. R. Hamann, Phys. Rev. B 37, 10 623 (1988).
8. G. Bergmann, Phys. Rep. 107, 2 (1984).
9. G. Bergmann, Solid State Commun. 42, 815 (1982).
10. i.
11. P. Santhanam, S. Wind, and D. E. Prober, Phys. Rev. B 35, 3188 (1987).
12. B. L. Alt'shuler and A. G. Aronov, Pis'ma Zh. Eksp. Teor. Fiz. 33, 515 (1981) [JETP Lett. 33, 499 (1981)].
13. B. L. Alt'shuler and A. G. Aronov, Pis'ma Zh. Eksp. Teor. Fiz. 33, 515 (1981) [JETP Lett. 33, 499 (1981)].
14. A. I. Larkin, Pis'ma Zh. Eksp. Teor. Fiz. 31, 239 (1980) [JETP Lett. 31, 219 (1980)].
15. A. I. Larkin, Pis'ma Zh. Eksp. Teor. Fiz. 31, 239 (1980) [JETP Lett. 31, 219 (1980)].