New modified phase locked loop method for fringe pattern demodulation

Optical Engineering

Volumn 36, Issue 7, 1997, Pages 2025-2030

  Kozlowski, Janusz ^a,b,c   Serra, Giovanni ^a,c,d  

^a Assoc Istituzione Libera Univ N   (Italy)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^c Assoc Inst Free Univ of Nuoro   (Italy)

^d POLITECNICO DI TORINO   (Italy)

Author keywords

Fringe analysis; Optical metrology; Phase measurement; Profilometry; Surface inspection; Three dimensional metrology

Indexed keywords

EID: 0007044191     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601382     Document Type: Article

References (13)

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