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Volumn 39, Issue 16, 2000, Pages 2719-2726

Effect of local microroughness on the gloss uniformity of printed paper surfaces

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT REFLECTION; LIGHT SCATTERING; PAPER; SURFACE ROUGHNESS;

EID: 0006970235     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.002719     Document Type: Article
Times cited : (63)

References (15)
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    • (1997) Tappi J , vol.80 , Issue.5 , pp. 163-172
    • Donigian, D.W.1    Ishley, J.N.2    Wise, K.J.3
  • 4
    • 5644253787 scopus 로고    scopus 로고
    • (ASTM, West Con-shohocken, Pa
    • American Society for Testing and Materials standard E 284-98a, “Standard terminology of appearance” (ASTM, West Con-shohocken, Pa., 1998).
    • (1998) Standard Terminology of Appearance
  • 5
    • 0037993616 scopus 로고
    • Analysis of light scattered from a surface of low gloss into its specular and diffuse components
    • W. W. Barkas, “Analysis of light scattered from a surface of low gloss into its specular and diffuse components, ” Proc. Phys. Soc. 51, 274-295 (1939).
    • (1939) Proc. Phys. Soc. , vol.51 , pp. 274-295
    • Barkas, W.W.1
  • 8
    • 0022951615 scopus 로고
    • Comments on the correlation length
    • K. Creath, ed., Proc. SPIE 680
    • E. L. Church, “Comments on the correlation length, ” in Surface Characterization and Testing, K. Creath, ed., Proc. SPIE 680, 102-111 (1986).
    • (1986) Surface Characterization and Testing , pp. 102-111
    • Church, E.L.1
  • 11
    • 0001586594 scopus 로고
    • Submillimeter gloss variations in coated paper
    • the gloss imaging equipment and analytical techniques
    • M. A. MacGregor and P.-A. Johansson, “Submillimeter gloss variations in coated paper: part I, the gloss imaging equipment and analytical techniques, ” Tappi J. 73(12), 161-168 (1990).
    • (1990) Tappi J , vol.73 , Issue.12 , pp. 161-168
    • Macgregor, M.A.1    Johansson, P.-A.2
  • 12
    • 85010141652 scopus 로고
    • Design review of a unique out-ofplane polarimetric scatterometer
    • R. P. Breault, ed., Proc. SPIE 1753, Dimension 3000 scanning-probe microscope (Digital Instruments, Veeco Process Metrology, 112 Robin Hill Road, Goleta, Calif
    • T. D. Schiff, J. C. Stover, D. J. Wilson, B. D. Swimley, M. E. Southwood, and D. R. Bjork, “Design review of a unique out-ofplane polarimetric scatterometer, ” in Stray Radiation in Optical Systems II, R. P. Breault, ed., Proc. SPIE 1753, 262-268 (1994). Dimension 3000 scanning-probe microscope (Digital Instruments, Veeco Process Metrology, 112 Robin Hill Road, Goleta, Calif. 931-17).
    • (1994) Stray Radiation in Optical Systems II , pp. 262-268
    • Schiff, T.D.1    Stover, J.C.2    Wilson, D.J.3    Swimley, B.D.4    Southwood, M.E.5    Bjork, D.R.6
  • 13
    • 0009735651 scopus 로고
    • Three-dimensional evaluation of paper surfaces using confocal microscopy
    • T. E. Conners and S. Bannerjee, eds. (CRC Press, Boca Raton, Fla, Chap. 1
    • M.-C. Beland and P. J. Mangin, “Three-dimensional evaluation of paper surfaces using confocal microscopy, ” in Surface Analysis ofPaper, T. E. Conners and S. Bannerjee, eds. (CRC Press, Boca Raton, Fla., 1995), Chap. 1.
    • (1995) Surface Analysis Ofpaper
    • Beland, M.-C.1    Mangin, P.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.