Internal photoemission at the Si/SiO2 and Si/metal interface

Journal of Applied Physics

Volumn 81, Issue 9, 1997, Pages 6482-6484

  Boedecker, K ^a   Konenkamp R ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006943486     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364434     Document Type: Article

References (13)

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