Electrostatic analysis of field emission triode with volcano-type gate

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 3, 1996, Pages 1938-1941

  Wang, Baoping ^a   Tong, Linsu ^a   Sin, Johnny K O ^b   Poon, Vincent M C ^b  

^a SOUTHEAST UNIVERSITY   (China)

^b HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006896195     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588959     Document Type: Article

References (5)

1. H. H. Busta et al., IEEE Trans. Electron Devices 40, 1530 (1993).
2. H. H. Busta et al., J. Vac. Sci. Technol. B 11, 400 (1993).
3. B. P. Wang and L. Tong, Dig. IVMC 94, 375 (1994).
4. T. Utsumi, IEEE Trans. Electron Device, 38, 2276 (1991).
5. H. F. Gray and J. L. Shaw, Dig. IVMC 95, 29 (1995).