New quality control with standardless clinker phase determination using the Rietveld refinement;Neue Qualitätssicherung mit standardfreier Klinkerphasenbestimmung nach der Rietveld-Verfeinerung im Einsatz

ZKG International

Volumn 51, Issue 3, 1998, Pages 152-162

  Meyer, H W ^a   Neubauer, J ^a   Malovrh, S ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006821270     PISSN: 09490205     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (9)

1. Rietveld, H. M.: Line profiles of neutron powder-diffraction peaks for structure refinement. Acta Cryst. 22 (1967) pp. 151-152.
2. Rietveld, H. M.: A profile refinement method for nuclear and magnetic structures. Jour. Appl. Cryst. 2 (1969) pp. 65-71.
3. 3A in the presence of gypsum. Proc. 18th Int. Conf. Cem. Mic., Houston (1996) pp. 87-99.
4. Neubauer, J., Kuzel, H. J., Sieber, R.: Rietveld quantitative XRD analysis of Portland cement: II. Quantification of synthetic and technical portland cement clinkers. - Proc. 18th Int. Conf. Cem. Mic., Houston (1996) pp. 100-111.
5. Neubauer, J. Pöllmann, H., Meyer H. W.: Quantitative X-ray analysis of OPC clinker by Rietveld refinement. - Proc. 10th Int. Congr. Chem. Cem., Göteborg, Vol. 3, 3v007, 12 p., 1997.
6. Götz-Neunhoeffer, F., Neubauer, J.: Crystal structure refinement of a Na-subsituted C3A by Rietveld analysis and quantification. - Proc. 10th Int. Congr. Chem. Cem., Göteborg, Vol. 1, li056, 8 p., 1997.
7. Möller, H.: Standardless quantitative phase analysis of Portland cement clinker. World Cement 9 (1995) pp. 75-84.
8. Möller, H.: Automatische Profilentfaltung nach Rietveld zur standardlosen quantitativen Phasenanalyse. ZKG INTERNATIONAL 51 (1998) No. 1, pp. 40-50.
9. Neubauer, J., Meyer, H. W., Pöllmann, H.: Quantitative X-ray analysis of OPC clinker. Comparison of Bogue. Microscopical, and Rietveld data. Europ. Journ. Min., Vol. 9, 1997.