Preparation and electrical properties of sol-gel derived antiferroelectric Pb0.99[(Zr0.6Sn0.4)0.96Ti 0.04]0.98Nb0.02O3 thin films

Ferroelectrics

Volumn 225, Issue 1-4, 1999, Pages 193-200

  Jang, Jae Hyuk ^a   Yoon, Ki Hyun ^a  

^a Yonsei University   (South Korea)

Author keywords

Antiferroelectric; Degradation; Microstructure; Pb0.99 (Zr0.6Sn0.4)0.96Ti 0.04 0.98Nb0.02O3 thin fims; Rosettes

Indexed keywords

EID: 0006784244     PISSN: 00150193     EISSN: None     Source Type: Journal    
DOI: 10.1080/00150199908009127     Document Type: Article

References (11)

1. K. Uchino, Jpn. J. Appl. Phys., 24, Suppl. 24-2, 460 (1985).
2. C. Zhiming, L. Jingyu, and W. Yongling, Ferroelectrics, 101, 225 (1990).
3. P. Yang and D. A. Payne, J. Appl. Phys., 71, 1361 (1992).
4. D. Viehland, D. Forst, Z. Xu, and J.-F. Li, J. Am. Ceram. Soc., 78, 2101 (1995).
5. C. M. Foster, G.-R. Bai, R. Csencsits, J. Vetrone, R. Jammy, L. A. Wills, E. Carr, and J. Amano, J. Appl. Phys., 81, 2349 (1997).
6. C. K. Kwok and S. B. Desu, Ceram Trans., 25, 73 (1992).
7. L. N. Chapin and S. A. Myers, Mater. Res. Soc. Symp. Proc., 200, 153 (1990).
8. G.W. Sherer and T.J. Garono, J. Am. Ceram. Soc., 68, 216 (1985).
9. T. Tani, Z. Xu, and D. A. Payne, Mater. Res. Soc. Symp. Proc., 310, 269 (1993).
10. Q. Y. Jiang, E. C. Subbarao. and L. E. Cross, J. Appl. Phys., 75, 7433 (1994).
11. J. H. Jang and K. H. Yoon, Jpn. J. Appl. Phys., 37, 9B. (1998) to be published.