Aluminum Phosphate by XPS

Surface Science Spectra

Volumn 5, Issue 1, 1998, Pages 60-66

  Rotole, John A ^a   Sherwood, Peter M A ^a  

^a KANSAS STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

BAND REGION; C 1S CORE LEVEL; MONOCHROMATIC RADIATION; MONOCHROMATICS; PEAK STRUCTURE; X RAY SATELLITES; X-RADIATION; XPS SPECTRUM;

VALENCE BANDS;

EID: 0006745561     PISSN: 10555269     EISSN: 15208575     Source Type: Journal    
DOI: 10.1116/1.1247858     Document Type: Article

References (3)

1. I. D.Welsh and P. M. A.Sherwood, Chem. Mater. 4, 133 (1992). 10.1021/cm00019a028
2. ASTM, E902-93, 1994 Annual Book of ASTM Standards (American Society for Testing and Materials, Philadelphia, 1994), Vol. 03.06.
3. M. P.Seah and G. C.Smith, in Practical Analysis by Auger and X-ray Photoelectron Spectroscopy, 2nd ed., edited by D.Briggs and M. P.Seah (Wiley, New York, 1990), Vol. 1, p. 535.