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Volumn 26, Issue 6, 1998, Pages 532-538

Vickers Hardness Indentations Measured with Atomic Force Microscopy

Author keywords

Atomic force microscopy; Diagonal length; Indentation depth; Indentation profile; Metrology; Vickers hardness

Indexed keywords


EID: 0006694750     PISSN: 00903973     EISSN: None     Source Type: Journal    
DOI: 10.1520/jte12111j     Document Type: Article
Times cited : (8)

References (27)
  • 1
    • 85066649204 scopus 로고
    • American Society for Metals, Metals Park, OH
    • Newby, J. R., Metals Handbook, Vol. 8, 9th ed., American Society for Metals, Metals Park, OH, 1985, pp. 71-113.
    • (1985) Metals Handbook, Vol. 8, 9th Ed. , vol.8 , pp. 71-113
    • Newby, J.R.1
  • 2
    • 85066707367 scopus 로고
    • Situation of Standardization in the Field of Hardness Testing of Metals
    • Wehrstedt, A., "Situation of Standardization in the Field of Hardness Testing of Metals," Journal of Testing and Evaluation, Vol. 23, 1995, pp. 405-407.
    • (1995) Journal of Testing and Evaluation , vol.23 , pp. 405-407
    • Wehrstedt, A.1
  • 3
    • 38249039368 scopus 로고
    • Problems in the Measurement of Vickers and Brinell Indentations
    • Barbato, G. and Desogus, S., "Problems in the Measurement of Vickers and Brinell Indentations," Measurement, Vol. 4, 1986, pp. 137-147.
    • (1986) Measurement , vol.4 , pp. 137-147
    • Barbato, G.1    Desogus, S.2
  • 4
    • 0022175233 scopus 로고
    • Use of the Scanning Electron Microscope in Microhardness Testing of High-Hardness Materials
    • P. J. Blau and B. R. Lawn, Eds., American Society for Testing and Materials, Philadelphia, PA
    • Westrich, R. M., "Use of the Scanning Electron Microscope in Microhardness Testing of High-Hardness Materials," Microindentation Techniques in Materials Science and Engineering, ASTM STP 889, P. J. Blau and B. R. Lawn, Eds., American Society for Testing and Materials, Philadelphia, PA, 1986, pp. 196-205.
    • (1986) Microindentation Techniques in Materials Science and Engineering, ASTM STP 889 , pp. 196-205
    • Westrich, R.M.1
  • 5
    • 85066648504 scopus 로고
    • Ultra-Microhardness Tester for Scanning Electronmicroscope Load Range 50 μN-400 mN
    • VDI Berichte 1194, Düsseldorf
    • Bangert, H. and Doppler, P., "Ultra-Microhardness Tester for Scanning Electronmicroscope Load Range 50 μN-400 mN,μ Härteprüfung in Theorie und Praxis, VDI Berichte 1194, Düsseldorf, 1995, pp. 179-189.
    • (1995) Härteprüfung in Theorie und Praxis , pp. 179-189
    • Bangert, H.1    Doppler, P.2
  • 8
    • 0026853962 scopus 로고
    • The Determination of Surface Plastic and Elastic Properties by Ultra Micro-indentation
    • Bell, T. J., Bendeli, A., Field, J. S., Swain, M. V., and Thwaite, E. G., "The Determination of Surface Plastic and Elastic Properties by Ultra Micro-indentation," Metrologia, Vol. 28, 1991/92, pp. 463-469.
    • (1991) Metrologia , vol.28 , pp. 463-469
    • Bell, T.J.1    Bendeli, A.2    Field, J.S.3    Swain, M.V.4    Thwaite, E.G.5
  • 10
    • 0028468481 scopus 로고
    • Estimation of Young's Modulus and of Hardness by Ultra-Low Load Hardness Tests with a Vickers Indenter
    • Trindade, A. C., Cavaleiro, A., and Fernandes, J. V., "Estimation of Young's Modulus and of Hardness by Ultra-Low Load Hardness Tests with a Vickers Indenter," Journal of Testing and Evaluation, Vol. 22, 1994, pp. 365-369.
    • (1994) Journal of Testing and Evaluation , vol.22 , pp. 365-369
    • Trindade, A.C.1    Cavaleiro, A.2    Fernandes, J.V.3
  • 11
    • 0020832196 scopus 로고
    • Hardness Measurement at Penetration Depths as Small as 20 nm
    • Pethica, J. B., Hutchings, R., and Oliver, W. C., "Hardness Measurement at Penetration Depths as Small as 20 nm," Philosophical Magazine A, Vol. 48, 1983, pp. 593-606.
    • (1983) Philosophical Magazine A , vol.48 , pp. 593-606
    • Pethica, J.B.1    Hutchings, R.2    Oliver, W.C.3
  • 12
    • 0026900117 scopus 로고
    • Imaging of Low-Load Indentations into Si and GaAs by Scanning Tunneling Microscopy
    • Castell, M. R., Walls, M. G., and Howie, A., "Imaging of Low-Load Indentations into Si and GaAs by Scanning Tunneling Microscopy," Ultramicroscopy, Vol. 42-44, 1992, pp. 1490-1497.
    • (1992) Ultramicroscopy , vol.42-44 , pp. 1490-1497
    • Castell, M.R.1    Walls, M.G.2    Howie, A.3
  • 13
    • 0001617115 scopus 로고
    • Importance of Load Cell Sensitivity in Determination of the Load Dependence of Hardness in Recording Microhardness Tests
    • Mason, W., Johnson, P. F., and Varner, J. R., "Importance of Load Cell Sensitivity in Determination of the Load Dependence of Hardness in Recording Microhardness Tests," Journal of Materials Science, Vol. 26, 1991, pp. 6576-6580.
    • (1991) Journal of Materials Science , vol.26 , pp. 6576-6580
    • Mason, W.1    Johnson, P.F.2    Varner, J.R.3
  • 14
    • 0001620144 scopus 로고
    • Measurement of Nanomechanical Properties of Metals Using the Atomic Force Microscope
    • Hues, S. M., Draper, C. F., and Colton, R. J., "Measurement of Nanomechanical Properties of Metals Using the Atomic Force Microscope," Journal of Vacuum Science and Technology B, Vol. 12, 1994, pp. 2211-2214.
    • (1994) Journal of Vacuum Science and Technology B , vol.12 , pp. 2211-2214
    • Hues, S.M.1    Draper, C.F.2    Colton, R.J.3
  • 15
    • 0027001018 scopus 로고
    • Three-Dimensional Characterization of Indentation Topography: Visual Characterization
    • Sullivan, P. J. and Blunt, L., "Three-Dimensional Characterization of Indentation Topography: Visual Characterization," Wear, Vol. 159, 1992, pp. 207-221.
    • (1992) Wear , vol.159 , pp. 207-221
    • Sullivan, P.J.1    Blunt, L.2
  • 16
    • 0026839782 scopus 로고
    • STM Profilometry of Low-Load Vickers Indentations in a Silicon Crystal
    • Walls, M. G., Chaudhri, M. M., and Tang, T. B., "STM Profilometry of Low-Load Vickers Indentations in a Silicon Crystal," Journal of Physics D: Applied Physics, Vol. 25, 1992, pp. 500-507.
    • (1992) Journal of Physics D: Applied Physics , vol.25 , pp. 500-507
    • Walls, M.G.1    Chaudhri, M.M.2    Tang, T.B.3
  • 18
    • 85066655978 scopus 로고
    • Investigations of the Thickness of Coatings and of the Geometry of Hardness Indenters by Scanning Force Microscopy
    • M. Bonis, Y. Alayli, P. Revel, P.A. McKeown, and J. Corbett, Eds., Proceedings, Eighth International Precision Engineering Seminar
    • Ahbe, T., Bienias, M., Hasche, K., and Thiele, K., "Investigations of the Thickness of Coatings and of the Geometry of Hardness Indenters by Scanning Force Microscopy," International Progress in Precision Engineering, M. Bonis, Y. Alayli, P. Revel, P.A. McKeown, and J. Corbett, Eds., Proceedings, Eighth International Precision Engineering Seminar, 1995, pp. 207-210.
    • (1995) International Progress in Precision Engineering , pp. 207-210
    • Ahbe, T.1    Bienias, M.2    Hasche, K.3    Thiele, K.4
  • 19
    • 85066639512 scopus 로고    scopus 로고
    • Determination of the Geometry of Microhardness Indenters with a Scanning Force Microscope
    • 26-30 May 1997, Braunschweig, Germany
    • Hasche, K., Hermann, K., Pohlenz, F., and Thiele, K., "Determination of the Geometry of Microhardness Indenters with a Scanning Force Microscope," Proceedings, Ninth International Precision Engineering Seminar, 26-30 May 1997, Braunschweig, Germany, Vol. 1, 1997, pp. 288-291.
    • (1997) Proceedings, Ninth International Precision Engineering Seminar , vol.1 , pp. 288-291
    • Hasche, K.1    Hermann, K.2    Pohlenz, F.3    Thiele, K.4
  • 20
    • 85066679396 scopus 로고    scopus 로고
    • DFM-96-R24, Danish Institute of Fundamental Metrology, Lyngby, Denmark, For a free copy of the program email to jfj@dfm.dtu.dk
    • Jørgensen, J. F., "SPIP 96 The Scanning Probe Image Processor User's Guide Version 3.0," DFM-96-R24, Danish Institute of Fundamental Metrology, Lyngby, Denmark, 1996. For a free copy of the program email to jfj@dfm.dtu.dk.
    • (1996) SPIP 96 the Scanning Probe Image Processor User's Guide Version 3.0
    • Jørgensen, J.F.1
  • 21
    • 85066722091 scopus 로고    scopus 로고
    • The reference grid is a "surface topography standard" from VLSI Standards Incorporated, CA. It comes with certified values from the manufacturer
    • The reference grid is a "surface topography standard" from VLSI Standards Incorporated, CA. It comes with certified values from the manufacturer.
  • 22
    • 0002408798 scopus 로고
    • Dimensional Metrology with Scanning Probe Microscopes
    • Griffith, J. E. and Grigg, D. A., "Dimensional Metrology with Scanning Probe Microscopes," Journal of Applied Physics Vol. 74, 1993, pp. R83-R109.
    • (1993) Journal of Applied Physics , vol.74
    • Griffith, J.E.1    Grigg, D.A.2
  • 24
    • 0003492094 scopus 로고
    • International Organization for Standardization, ISBN 92-67-10188-9
    • "Guide to the Expression of Uncertainty in Measurement," International Organization for Standardization, ISBN 92-67-10188-9, 1993.
    • (1993) Guide to the Expression of Uncertainty in Measurement
  • 25
    • 0542414200 scopus 로고
    • Automatic Vickers Indentation Measurement
    • F. M. Mazzolani, Ed., RILEM, E & FN Spon, London
    • Barbato, G., Desogus, S., and Grattoni, P., "Automatic Vickers Indentation Measurement," Testing of Metals for Structures, F. M. Mazzolani, Ed., RILEM, E & FN Spon, London, 1992, pp. 319-336.
    • (1992) Testing of Metals for Structures , pp. 319-336
    • Barbato, G.1    Desogus, S.2    Grattoni, P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.