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Volumn 57, Issue 9, 1998, Pages 5122-5125
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X-ray diffraction, thermal analysis, and Raman scattering study of and comparison to other members of the family with ferroelectric-paraelectric transitions
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0006652775
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.57.5122 Document Type: Article |
Times cited : (4)
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References (17)
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