메뉴 건너뛰기




Volumn 57, Issue 9, 1998, Pages 5122-5125

X-ray diffraction, thermal analysis, and Raman scattering study of and comparison to other members of the family with ferroelectric-paraelectric transitions

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0006652775     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.57.5122     Document Type: Article
Times cited : (4)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.