-
1
-
-
33748444548
-
-
Apperley, D. C., Clegg, W., Coles, S., Coyle, J. C., Martin, N., Maubert, B., McKee, V. & Nelson, J. (1999). J. Chem. Soc. Dalton Trans. pp. 229-236.
-
(1999)
J. Chem. Soc. Dalton Trans.
, pp. 229-236
-
-
Apperley, D.C.1
Clegg, W.2
Coles, S.3
Coyle, J.C.4
Martin, N.5
Maubert, B.6
McKee, V.7
Nelson, J.8
-
2
-
-
33748485810
-
-
Bligh, S. W. A., Drew, M. G. B., Martin, N., Maubert, B. & Nelson, J. (1998). J. Chem. Soc. Dalton Trans. pp. 3711-3713.
-
(1998)
J. Chem. Soc. Dalton Trans.
, pp. 3711-3713
-
-
Bligh, S.W.A.1
Drew, M.G.B.2
Martin, N.3
Maubert, B.4
Nelson, J.5
-
3
-
-
0343619615
-
-
Drew, M. G. B., Felix, V., McKee, V., Morgan, G. & Nelson, J. (1995). Supramol. Chem. 5, 281-287.
-
(1995)
Supramol. Chem.
, vol.5
, pp. 281-287
-
-
Drew, M.G.B.1
Felix, V.2
McKee, V.3
Morgan, G.4
Nelson, J.5
-
5
-
-
37049077235
-
-
Hunter, J., Nelson, J., Harding, C. J., McKee, V. & McCann, M. (1990). J. Chem. Soc. Chem. Commun. pp. 1148-1151.
-
(1990)
J. Chem. Soc. Chem. Commun.
, pp. 1148-1151
-
-
Hunter, J.1
Nelson, J.2
Harding, C.J.3
McKee, V.4
McCann, M.5
-
6
-
-
84987550813
-
-
Lehn, J.-M., Vigneron, J.-P., Bkouche-Waksman, I., Guilheim, J. & Pascard, C. (1992). Helv. Chim. Acta, 75, 1069-1077.
-
(1992)
Helv. Chim. Acta
, vol.75
, pp. 1069-1077
-
-
Lehn, J.-M.1
Vigneron, J.-P.2
Bkouche-Waksman, I.3
Guilheim, J.4
Pascard, C.5
-
7
-
-
54649083556
-
-
Nelson, J., McKee, V. & Morgan, G. (1998). Prog. Inorg. Chem. 47, 167-316.
-
(1998)
Prog. Inorg. Chem.
, vol.47
, pp. 167-316
-
-
Nelson, J.1
McKee, V.2
Morgan, G.3
-
8
-
-
84873413072
-
-
Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Sheldrick, G. M. (1990a). SHELXTL/PC. Users Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1990)
SHELXTL/PC. Users Manual
-
-
Sheldrick, G.M.1
-
11
-
-
0004100191
-
-
Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Siemens (1994). XSCANS. X-ray Single-Crystal Analysis System. Version 2.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1994)
XSCANS. X-ray Single-Crystal Analysis System. Version 2.1
-
-
-
12
-
-
0027752954
-
-
Smith, P. H., Barr, M. E., Brainard, J. R., Ford, D. K., Frieser, H., Muralidharar, S., Reilly, S. D., Ryan, R. R., Selles, L. A. & Yu, W. H. (1993). J. Org. Chem. 58, 7939-7941.
-
(1993)
J. Org. Chem.
, vol.58
, pp. 7939-7941
-
-
Smith, P.H.1
Barr, M.E.2
Brainard, J.R.3
Ford, D.K.4
Frieser, H.5
Muralidharar, S.6
Reilly, S.D.7
Ryan, R.R.8
Selles, L.A.9
Yu, W.H.10
|