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Volumn 80, Issue 3, 1996, Pages 1628-1632

Electrode effects in positive temperature coefficient and negative temperature coefficient devices measured by complex-plane impedance analysis

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0006607784     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362961     Document Type: Article
Times cited : (33)

References (24)
  • 9
    • 0347831401 scopus 로고
    • edited by B. Schwartz The Electrochemical Society, New York
    • S. H. Wemple, in Ohmic Contact to Semiconductors, edited by B. Schwartz (The Electrochemical Society, New York, 1969), p. 128.
    • (1969) Ohmic Contact to Semiconductors , pp. 128
    • Wemple, S.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.