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Volumn 3, Issue 2, 1996, Pages 59-60

Comportamiento de adhesion de crudos Venezolanos: De la formacion naricual sobre silice, calcita y muscovita

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0006553079     PISSN: 13150855     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (6)
  • 1
    • 0024898924 scopus 로고
    • Interfacial phenomena in miscible gas processes
    • Oct. 8-11, San Antonio, TX. SPE paper 19698
    • Rao, D. N., Girard, M., Sayegh, S. G., Interfacial phenomena in miscible gas processes. 64th SPE Tech. Conf.; Oct. 8-11, 1989. San Antonio, TX. SPE paper 19698.
    • (1989) 64th SPE Tech. Conf.
    • Rao, D.N.1    Girard, M.2    Sayegh, S.G.3
  • 3
    • 0025212947 scopus 로고
    • Characterization of crude oil wetting behavior by adhesion test
    • Apr. 22-25, Tulsa, OK. SPE/DOE paper 20263
    • Buckley, J. S., Morrow, N. R., Characterization of crude oil wetting behavior by adhesion test. 7th Symp. on Enhanced Oil Recovery; Apr. 22-25, 1990. Tulsa, OK. SPE/DOE paper 20263.
    • (1990) 7th Symp. on Enhanced Oil Recovery
    • Buckley, J.S.1    Morrow, N.R.2
  • 4
    • 0000821601 scopus 로고
    • Wettability of silane-treated glass slides as determined from X-ray photoelectron spectroscopy
    • Araujo, Y. C., Toledo, P. G., León, V., González, H. Y. Wettability of silane-treated glass slides as determined from X-ray photoelectron spectroscopy. J. Colloid Interface Sci., 176:485-490, 1995.
    • (1995) J. Colloid Interface Sci. , vol.176 , pp. 485-490
    • Araujo, Y.C.1    Toledo, P.G.2    León, V.3    González, H.Y.4
  • 5
    • 0029464024 scopus 로고
    • Evaluación de mojabilidad de rocas de yacimiento mediante espectroscopia de fotoelectrón de rayos X y espectroscopia de ion dispersado
    • Toledo, P. G., Araujo, Y. C., León, V. Evaluación de mojabilidad de rocas de yacimiento mediante espectroscopia de fotoelectrón de rayos X y espectroscopia de ion dispersado. Visión Tecnológica, 3(1):43-60, 1995.
    • (1995) Visión Tecnológica , vol.3 , Issue.1 , pp. 43-60
    • Toledo, P.G.1    Araujo, Y.C.2    León, V.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.