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Volumn 69, Issue 20, 1996, Pages 3019-3021
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Structural characterization of Zn-diffused InP layers by x-ray diffraction and standing-waves method
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0006516232
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.116825 Document Type: Article |
Times cited : (3)
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References (11)
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