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Volumn 69, Issue 20, 1996, Pages 3019-3021

Structural characterization of Zn-diffused InP layers by x-ray diffraction and standing-waves method

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0006516232     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116825     Document Type: Article
Times cited : (3)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.