An experiment in estimating reliability growth under both representative and directed testing

Proceedings of the 1998 ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 1998

Volumn , Issue , 1998, Pages 32-41

  Mitchell, Brian ^a   Zeil, Steven J ^a  

^a ECS Building   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NASA; RELIABILITY; TESTING;

DIRECTED TESTING; NASA LANGLEY RESEARCH CENTER; NATIONAL SCIENCE FOUNDATIONS; OPERATIONAL RELIABILITY; ORDER STATISTICS; RELIABILITY GROWTH; RELIABILITY GROWTH MODEL; TESTING METHODOLOGY;

SOFTWARE TESTING;

EID: 0006491549     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/271771.271784     Document Type: Conference Paper

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