Structural characterization of thin films formed or changed on materials by micro Raman spectroscopy

Fresenius' Journal of Analytical Chemistry

Volumn 361, Issue 6-7, 1998, Pages 619-620

  Witke, Klaus ^a   Brzezinka, Klaus Werner ^a   Reich, Peter ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006484434     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050969     Document Type: Article

References (11)

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11. Payen E, Dhamelincourt MC, Dhamelincourt P, Grimblot J, Bonnelle JP (1982) Appl Spectr 36:30