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Volumn 4, Issue 50, 1992, Pages 10199-10210

Radiation-induced defects in solid solutions and intermetallic compounds based on the Ni-Al system: I. Low-temperature electron-irradiation damage

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0006451835     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/4/50/009     Document Type: Article
Times cited : (17)

References (45)
  • 30
    • 84967941495 scopus 로고
    • (1973) , vol.49 , Issue.1 , pp. 101
    • Oen, OS1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.