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Volumn 4, Issue 50, 1992, Pages 10199-10210
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Radiation-induced defects in solid solutions and intermetallic compounds based on the Ni-Al system: I. Low-temperature electron-irradiation damage
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0006451835
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/4/50/009 Document Type: Article |
Times cited : (17)
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References (45)
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