![]() |
Volumn , Issue , 1997, Pages 42-48
|
Multi layer metallization
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DIELECTRIC MATERIALS;
SILICON OXIDES;
CIRCUIT DENSITY;
DESIGN AND TECHNOLOGY;
INTERCONNECT PERFORMANCE;
SCALING DOWN;
INTEGRATED CIRCUIT INTERCONNECTS;
|
EID: 0006414852
PISSN: 19308876
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ESSDERC.1997.194378 Document Type: Conference Paper |
Times cited : (3)
|
References (15)
|