Trapping noise in semiconductor devices: A method for determining the noise spectrum as a function of the trap position

Journal of Applied Physics

Volumn 78, Issue 10, 1995, Pages 6283-6297

  Longoni, A ^a   Gatti, E ^a   Sacco, R ^a  

^a POLITECNICO DI MILANO   (Italy)

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EID: 0006320613     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.360509     Document Type: Article

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