Effects of a series resistor on electron emission from a field emitter

Applied Physics Letters

Volumn 69, Issue 18, 1996, Pages 2770-2772

  Luginsland, J W ^a   Valfells, A ^a   Lau, Y Y ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006282582     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117670     Document Type: Article

References (9)

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2. J. P. Calame, H. F. Gray, and J. L. Shaw, J. Appl. Phys. 73, 1485 (1993).
3. R. K. Parker and R. H. Abrams, International Electron Devices Meeting, Technical Digest (Institute of Electrical and Electronic Engineers, New York, 1990), p. 7.1.1 [IEEE Catalog No. 90CH2865-4].
4. J. D. Levine, J. Vac. Sci. Technol. B 13, 474 (1995); 14, 2008 (1996); J. D. Levine et al., ibid. 13, 553 (1995).
5. J. D. Levine, J. Vac. Sci. Technol. B 13, 474 (1995); 14, 2008 (1996); J. D. Levine et al., ibid. 13, 553 (1995).
6. J. D. Levine, J. Vac. Sci. Technol. B 13, 474 (1995); 14, 2008 (1996); J. D. Levine et al., ibid. 13, 553 (1995).
7. Y. Y. Lau, Y. Liu, and R. K. Parker, Phys. Plasmas 1, 2082 (1994).
8. The Child-Langmuir Law is also obtained at very high current density for the case of nonzero surface electric field that is required for field emission. This observation is implicit in Ref. 5. For details, see Youfan Liu, Ph.D. thesis, University of Michigan, Ann Arbor, Michigan, 1996.
9. 2), which yields S.