Si x emission lines in spectra obtained with the Solar EUV Rocket Telescope and Spectrograph (SERTS)

Monthly Notices of the Royal Astronomical Society

Volumn 315, Issue 3, 2000, Pages 450-456

  Keenan, F P ^a   O'Shea, E ^a   Thomas, R J ^b   Brosius, J W ^b   Katsiyannis, A ^a   Ryans, R S I ^a   Reid, R H G ^a   Pradhan, A K ^c   Zhang, H L ^d  

^a QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

^c OHIO STATE UNIVERSITY   (United States)

^d LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Atomic data; Sun: activity; Sun: flares; Ultraviolet: general

Indexed keywords

CARRIER CONCENTRATION; ELECTROMAGNETIC WAVE EMISSION; ELECTRON DENSITY MEASUREMENT; ELECTRONS; IMPACT IONIZATION; ROCKETS; SILICON COMPOUNDS; SPECTROGRAPHS; TELESCOPES;

ATOMIC DATA; EMISSION LINES; EXCITATION RATE; LINE RATIOS; R-MATRIX CALCULATION; SOLAR EUV; SPECTRA'S; SUN: ACTIVITY; SUN:FLARES; ULTRAVIOLET: GENERAL;

SOLAR ENERGY;

EID: 0006275207     PISSN: 00358711     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-8711.2000.03599.x     Document Type: Article

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