The coherency loss microstructure at a cdte/gaas(001) interface

Philosophical Magazine Letters

Volumn 67, Issue 4, 1993, Pages 279-285

  Angelo, J E ^a   Gerberich, W W ^a   Stobbsi, W M ^b   Bratina, G ^c   Sorba, L ^c   Franciosa, A ^c  

^a UNIVERSITY OF MINNESOTA   (United States)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c LABORATORIO TASC   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006245699     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/09500839308240940     Document Type: Article

References (10)

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9. Sorba, L., Bratina, G., Antonini, A., Franciosi, A., Tapfer, L., Migliori, A., and Merli, P., 1992, Phys. Rev. B, 46, 6834.
10. Vannuffel, C., Beaucour, J., André, J. P., and Chevalier, J. P., 1989, Microsc. of Semicond. Mater., edited by A. G. Cullis and J. L. Hutchinson (Bristol: Institute of Physics), p. 115.