Construction of a double-radius Guinier diffractometer using Mo Kα1 radiation and a one- or two-dimensional detection system

Journal of Applied Crystallography

Volumn 29 PART 4, Issue , 1996, Pages 495-497

  Otto, H H ^a   Hofmann, W ^a  

^a CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006204106     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/s0021889896005377     Document Type: Article

References (6)

1. Johansson, T. (1932). Naturwissenschaften, 20, 758.
2. Göbel, H. E. (1982). Adv. X-ray Anal. 25, 315-324.
3. Guinier, A. (1946). C. R. Acad. Sci. Paris, 223, 31.
4. Hofmann, E.-G. & Jagodzinski, H. (1955). Z. Metallkde. 46, 601-610.
5. Jost, K. (1975). Röntgenbeugung an Kristallen, p. 28. Rheine: Heyden.
6. Miyahara, J. (1989). Chem. Today, 223, 29-36.