Macroscopic Creep of 2.5D Cf-SiC

Key Engineering Materials

Volumn 164-165, Issue , 1999, Pages 317-320

  Boitier, G ^a   Chermant, J L ^a   Vicens, J ^a  

^a CNRS   (France)

Author keywords

Cf SiC; Creep; Creep Rate; Damage; Tensile Tests

Indexed keywords

EID: 0006147798     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: None     Document Type: Article

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