Photon assisted tunneling from aluminum into silicon dioxide

Solid State Communications

Volumn 20, Issue 3, 1976, Pages 179-182

  Weinberg, Z A ^a   Hartstein, A ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006111143     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1098(76)90170-8     Document Type: Article

References (14)

1. Electrical Conduction and Dielectric Breakdown in Silicon Dioxide Films on Silicon