Assessment of SI GaAs particle detectors

Materials Science and Engineering B

Volumn 44, Issue 1-3, 1997, Pages 330-333

  Berwick, K ^a   Brozel, M R ^a   Buttar, C M ^b   Sellin, P ^b   Young, ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Charge collection coefficient; Minimum ionizing particles; Thermally stimulated current

Indexed keywords

COMPOSITION EFFECTS; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRONS; SEMICONDUCTING GALLIUM ARSENIDE;

CHARGE COLLECTION EFFICIENCY (CCE); THERMALLY STIMULATED CURRENT;

PARTICLE DETECTORS;

EID: 0006102419     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(96)01815-6     Document Type: Article

References (16)

1. D.S. McGregor, G.F. Knoll, Y. Eisen, R. Brake, IEEE Trans. Nucl. Sci., 39 (1992) 1226.
2. G.M. Martin, Proc. Conf. Semi-Insulating III-V Mats., Shiva, UK, 1980, p. 13.
3. R. Bertin, S. D'Auria, C. del Papa, F. Fori et al., Nucl. Instr. Methods Phys. Res., A2945 (1990) 211.
4. F. Nava et al., Nucl. Instr. Methods Phys. Res., A349 (1994) 156.
5. K. Berwick, M.R. Brozel, C. Buttar, M. Cowperthwaite, P. Sellin and Y. Hou, Inst. Phys. Conf. Ser., Vol. 135, IOP, Bristol, 1994.
6. G. Cavalleri et al., Nucl. Inst. Methods Phys. Res., 92 (1971) 137.
7. P.J. Sellin, C.M. Buttar, SManopoulos, K. Berwick, M.R. Brozel and M. Cowperthwaite, IEEE Trans. Nucl. Sci., 42 (1995) 247.
8. P. Blood, W. Orton, Electrical Characterisation of semiconductors, majority carrier and electron states, Techniques in Physics, 1992, p. 14.
9. G.M. Martin, Appl. Phys. Lett., 39 (1981) 747.
10. R. Stibal, J. Windscheif and W. Jantz, Semicond. Sci. Technol., 6 (1991) 995.
11. J.S. Pooni, M.R. Brozel, Inst. Phys. Conf. Ser., Vol. 135, IOP, Bristol, 1994.
12. M. Rogalla, J.W. Chen, R. Geppert, M. Kienzle, R. Irsigler, J. Ludwig et al., Proc. Ninth Int. Conf. on Room Temperature Xand Gamma ray Detectors, Grenoble, France, 1995, to be published in Nucl. Instr. and Methods in Physics Research.
13. M.R. Brozel and S. Tuzemen, IOP Conf. Ser., 135 (1994) 187.
14. M.R. Brozel, Properties of GaAs, 2nd edn., INSPEC, 1990, pp. 309-317.
15. V. Ya Prinz and B.A. Bobylev, Sov. Phys. Semicond., 14 (1980) 1097.
16. D.S. McGregor, R.A. Rojeshi, G.F. Knoll, F.L. Terry, J. East, Y. Eisen, J. Appl. Phys., 75 (2) (1994) 7910.