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Volumn 186, Issue 2, 2001, Pages 176-

What We Have Learned about Intrinsic Defects in Silicon: A Help in Understanding Diamond?

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EID: 0006100755     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396x(200108)186:2<176::aid-pssa167>3.0.co;2-8     Document Type: Article
Times cited : (11)

References (16)
  • 1
    • 0011470173 scopus 로고    scopus 로고
    • Chap. 3, Eds. K. A. JACKSON and W. SCHRÖTER, Wiley-VCH, Weinheim
    • G. D. WATKINS, in: Handbook of Semiconductor Technology, Vol. 1, Chap. 3, Eds. K. A. JACKSON and W. SCHRÖTER, Wiley-VCH, Weinheim 2000.
    • (2000) Handbook of Semiconductor Technology , vol.1
    • Watkins, G.D.1
  • 3
    • 1842648150 scopus 로고
    • Properties and Growth of Diamond, Ed. G. DAVIES, INSPEC, IEE, London
    • G. DAVIES and N. B. MANSON, in: Properties and Growth of Diamond, Ed. G. DAVIES, EMIS Data Review Series No. 9. INSPEC, IEE, London 1994 (p. 159).
    • (1994) EMIS Data Review Series No. 9 , pp. 159
    • Davies, G.1    Manson, N.B.2
  • 4
    • 0043119591 scopus 로고
    • Eds. J. SAITO, N. FUJIMORI, O. FUKUNADA, M. KANO, K. KOBASHI, and M. YOSHIGAWA, MYU, Tokyo
    • J. ISOYA, H. KANDA, and Y. MORITA, in: Advances in New Diamond Science and Technology, Eds. J. SAITO, N. FUJIMORI, O. FUKUNADA, M. KANO, K. KOBASHI, and M. YOSHIGAWA, MYU, Tokyo 1994 (p. 351).
    • (1994) Advances in New Diamond Science and Technology , pp. 351
    • Isoya, J.1    Kanda, H.2    Morita, Y.3
  • 7
    • 0017675778 scopus 로고
    • Industrial Diamond Research Bureau, London
    • J. H. N. LOUBSER and J. A. VAN WYK, in: Diamond Research, Vol. 77, Industrial Diamond Research Bureau, London 1977 (p. 11).
    • (1977) Diamond Research , vol.77 , pp. 11
    • Loubser, J.H.N.1    Van Wyk, J.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.