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Volumn 30, Issue 3, 1997, Pages 244-253
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The 'Seed-Skewness' Method for Integration of Peaks on Imaging Plates II. Analysis of Bias Due to Finite Size of the Peak Mask and Treatment of α1-α2 Splitting
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0006080580
PISSN: 00218898
EISSN: None
Source Type: Journal
DOI: 10.1107/S0021889896010205 Document Type: Article |
Times cited : (13)
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References (11)
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