Hot carrier degradation and bsd in submicrometer cmos technologies: how do they interact?

IEEE Transactions on Device and Materials Reliability

Volumn 1, Issue 1, 2001, Pages 23-32

  Groeseneken, Guido V ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006004389     PISSN: 15304388     EISSN: 15304388     Source Type: Journal    
DOI: 10.1109/7298.946457     Document Type: Article

References (47)

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