X-Ray Reflectivity Analysis Incorporated with Genetic Algorithm to Analyze the Y- To X Type Transition in CdA LB Film

Bulletin of the Korean Chemical Society

Volumn 19, Issue 5, 1998, Pages 549-553

  Choi, Jeong Woo ^a   Cho, Kyung Sang ^a   Rhee, Hee Woo ^a   Lee, Won Hong ^a   Lee, Han Sup ^b  

^a Sogang University   (South Korea)

^b Inha University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005971953     PISSN: 02532964     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (16)

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