Optimization of operating conditions for the FE gun system of HVEM

Journal of Electron Microscopy

Volumn 45, Issue 5, 1996, Pages 372-379

  Morita, Chiaki ^a   Ohye, Toshimi ^b   Shimoyama, Hiroshi ^b  

^a NAGOYA UNIVERSITY   (Japan)

^b MEIJO UNIVERSITY   (Japan)

Author keywords

Aberration; Accelerating tube; Electrostatic lens; Field emission gun; High voltage electron microscope

Indexed keywords

ELECTRODES; ELECTRON BEAMS; ELECTRONS; ELECTROSTATIC LENSES; FIELD EMISSION; OPTICAL INSTRUMENT LENSES;

ACCELERATING TUBE; ELECTRON OPTICAL CHARACTERISTICS; ELECTRON-BEAM; FIELD EMISSION GUNS; GUN SYSTEMS; HIGH VOLTAGE ELECTRON MICROSCOPE; NUMERICAL CALCULATION; OPERATING CONDITION; OPTIMIZATION OF OPERATING CONDITIONS; TUBE LENS;

ABERRATIONS;

EID: 0005963198     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023454     Document Type: Article

References (9)

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