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Volumn 611, Issue 1-2, 2000, Pages 531-536

Low-temperature growth of polycrystalline Si and Ge films by redox reactions of Si2H6 and GeF4

Author keywords

Crystal growth; Disilane; Germanium tetrafluoride; Polysilicon; Thermal CVD

Indexed keywords


EID: 0005943690     PISSN: 0022328X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-328X(00)00400-9     Document Type: Article
Times cited : (21)

References (25)
  • 13
    • 0348101046 scopus 로고    scopus 로고
    • Y. Matsu, J. Hanna, unpublished data
    • Y. Matsu, J. Hanna, unpublished data.
  • 16
    • 0346209896 scopus 로고    scopus 로고
    • M. Yamamato, M. Miyauchi, J. Hanna, unpublished data
    • M. Yamamato, M. Miyauchi, J. Hanna, unpublished data.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.