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Volumn 79, Issue 9, 1996, Pages 6803-6810

Characterization of TaSi2-Si composites for use as wide-bandpass optical elements for synchrotron radiation

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0005918551     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361501     Document Type: Article
Times cited : (7)

References (21)
  • 15
    • 85032997972 scopus 로고
    • edited by A. G. Cullis and P. D. Augustus, Institute of Physics Conference Series 87 IOP, Bristol, Sec. 11
    • B. G. Yacobi and B. M. Ditchek, in Microscopy of Semiconductor Materials, edited by A. G. Cullis and P. D. Augustus, Institute of Physics Conference Series 87 (IOP, Bristol, 1987), Sec. 11, p. 703.
    • (1987) Microscopy of Semiconductor Materials , pp. 703
    • Yacobi, B.G.1    Ditchek, B.M.2
  • 16
    • 0029232850 scopus 로고
    • Applications of Synchrotron Radiation Techniques to Materials Science II, MRS, Pittsburgh, PA
    • S. R. Stock, A. Guvenilir, D. P. Piotrowski, and Z. U. Rek, in Applications of Synchrotron Radiation Techniques to Materials Science II, Mater. Res. Soc. Proc. Vol. 375 (MRS, Pittsburgh, PA, 1995), p. 275.
    • (1995) Mater. Res. Soc. Proc. , vol.375 , pp. 275
    • Stock, S.R.1    Guvenilir, A.2    Piotrowski, D.P.3    Rek, Z.U.4
  • 18
    • 85033005748 scopus 로고    scopus 로고
    • Joint Committee for Powder Diffraction Standards, International Centre for Diffraction Data
    • Card 38-483, Powder Diffraction File, Joint Committee for Powder Diffraction Standards, International Centre for Diffraction Data.
    • Card 38-483, Powder Diffraction File


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.