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Volumn 369, Issue 2-3, 1996, Pages 445-451

The 222Rn reference measurement system developed at ENEA

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0005893463     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)80028-3     Document Type: Article
Times cited : (19)

References (12)
  • 3
    • 0000791885 scopus 로고    scopus 로고
    • these Proceedings (Symp. on Radionuclide Metrology and its Applications, Paris, France, 1995)
    • J.L. Picolo, these Proceedings (Symp. on Radionuclide Metrology and its Applications, Paris, France, 1995) Nucl. Instr. and Meth. A 369 (1996) 452.
    • (1996) Nucl. Instr. and Meth. A , vol.369 , pp. 452
    • Picolo, J.L.1
  • 10
    • 0003492094 scopus 로고
    • International Organization for Standardization, Geneva, Switzerland
    • ISO, Guide to the Expression of Uncertainty in Measurement, International Organization for Standardization, Geneva, Switzerland, 1993.
    • (1993) Guide to the Expression of Uncertainty in Measurement


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.