Transfer of samples between separated ultrahigh vacuum instruments for semiconductor surface studies

Review of Scientific Instruments

Volumn 69, Issue 7, 1998, Pages 2804-2805

  Jiriček P ^a   Cukr, M ^a   Kolarik V ^b   Koc, S ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b Delong Instruments   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005875886     PISSN: 00346748     EISSN: 10897623     Source Type: Journal    
DOI: 10.1063/1.1148982     Document Type: Letter

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