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Volumn 32, Issue 5, 1997, Pages 539-557

A unified approach for the investigation of branch and circuit defects

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0005865701     PISSN: 0094114X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0094-114X(96)00070-5     Document Type: Article
Times cited : (14)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.