Determination of optical parameters in general film-substrate systems: A reformulation based on the concepts of envelope extremes and local magnitudes

Applied Optics

Volumn 39, Issue 25, 2000, Pages 4557-4568

  Martínez Antón, Juan Carlos ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT ABSORPTION; LIGHT INTERFERENCE; PARAMETER ESTIMATION; REFRACTIVE INDEX; SUBSTRATES; THIN FILMS;

INTERFERENTIAL FILMS;

OPTICAL VARIABLES MEASUREMENT;

EID: 0005853343     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.004557     Document Type: Article

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